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KMID : 0385520000130050565
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Analytical Science & Technology
2000 Volume.13 No. 5 p.565 ~ p.572
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A Study on the Standards for Xe Analysis by Wavelength Dispersive X-ray Spectrometer (WDS) of Electron Probe Micro Analysis (EPMA)
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박순달/Park SD
하영경/김종구/지광용/김원호/Ha YK/Kim JG/Jee KY/Kim WH
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Abstract
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KEYWORD
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